James F. Garvey

PhD

James F. Garvey.

James F. Garvey

PhD

James F. Garvey

PhD

Education

  • Fulbright Fellow, University of Sussex, United Kingdom, 1994, 1996
  • Alfred P. Sloan Fellow, 1991-1993
  • Postdoctoral Scholar, University of California, Los Angeles, 1985-1987
  • PhD, California Institute of Technology, 1985
  • BS and MS, Georgetown University, 1978

Specializations

Thin Film Generation of Novel Materials, Mass Spectrometry of Clusters

Research Summary

Our group was interested in utilizing state-of-the-art mass spectrometric techniques to explore chemical reactions within gas-phase clusters (i.e., {CH3OH}n{H2O}H+, {C2H4}n+, etc.). We had five different experiments in order to study a wide variety of chemical systems:

  1. a continuous cluster beam source mated to a high resolution triple quadrupole mass spectrometer,
  2. a pulsed cluster beam source used in conjunction with a reflectron time-of-flight mass spectrometer for multiphoton studies,
  3. a metal cluster source used for the generation of thin films, utilizing a quadrupole mass spectrometer for beam diagnostics,
  4. a triple quadrupole mass spectrometer for the study of fullerene (C60) ion chemistry,
  5. a ZAB-SE tandem mass spectrometer which is used to conduct dissociation experiments on metallofullerene species (Sc@C60).