Matthew Crawley, Ph.D., manages the X-ray scattering facilities within the Chemistry Instrumentation Center (CIC). The CIC houses a Rigaku XtaLAB Synergy-S single-crystal diffractometer for single-crystal, powder, and PDF experiments, along with a Xenocs Xeuss 3.0 system for SAXS/WAXS/grazing incidence diffraction measurements. Our instrumentation allows for structural investigation of molecular and extended structures in the solid- and solution-state. Matthew facilitates data collection and assists users with advanced experiment design and data interpretation. Please direct X-ray scattering/diffraction experiment inquiries to mrcrawle@buffalo.edu.